The TEAM™ EDS Analysis System for the Scanning Electron Microscope (SEM) is offered with Octane Elect and Octane Elite EDS Systems for a wide range of applications. The TEAM™ EDS Analysis System coupled with Smart Features is the most intuitive and easy to use analytical tool available for the SEM.The TEAM™ Software Suite, coupled with the Octane Elect and Octane Elite Energy Dispersive Spectroscopy (EDS) Systems is the most intuitive and easy to use analytical tool available for the SEM. The workflow functions are automated by integrating years of EDAX knowledge and expertise to work for you. Startup, Analysis, and Reporting are easy because the TEAM™ software automates each task. It is the only EDS technology that combines smart decision making and guidance for the novice with advanced features for the experienced user.
Now you have the intelligence of an EDS expert every step of the way.
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EDAX offers three different EDS systems:The Element EDS System delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It is focused on the industrial market, where application specific problems need to be solved quickly and accurately. The combination of an Element Silicon Drift Detector (SDD) with the user friendly APEX™ software provides a complete EDS microanalysis solution for all levels of analysis and high throughput industrial applications.The Octane Elect EDS System is an enhanced EDS platform with the latest advancements in SDD technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.The game changing advancements in the Octane Elite SDDs take detector technology to the next level. These detectors incorporate a new silicon nitride window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite EDS System also uses state of the art electronics, which yield high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.